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Cryo Focused Ion Beam Applications in High Resolution Electron Microscopy Studies of Beam Sensitive Crystals

Published online by Cambridge University Press:  05 August 2019

Daliang Zhang ,
Nini Wei ,
Lingmei Liu ,
Kepeng Song ,
Ali Behzad ,
Alessandro Genovese  and
Yu Han
Daliang Zhang*
Affiliation:
King Abdullah University of Science and Technology (KAUST), Core Labs, Thuwal, Saudi Arabia
Nini Wei
Affiliation:
King Abdullah University of Science and Technology (KAUST), Core Labs, Thuwal, Saudi Arabia
Lingmei Liu
Affiliation:
KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal, Saudi Arabia
Kepeng Song
Affiliation:
KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal, Saudi Arabia
Ali Behzad
Affiliation:
King Abdullah University of Science and Technology (KAUST), Core Labs, Thuwal, Saudi Arabia
Alessandro Genovese
Affiliation:
King Abdullah University of Science and Technology (KAUST), Core Labs, Thuwal, Saudi Arabia
Yu Han
Affiliation:
KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal, Saudi Arabia
*
*Corresponding author: daliang.zhang@kaust.edu.sa

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1402 - 1403
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zhu, Y et al. , Nature Materials 16 (2017), p. 532.Google Scholar
[2]Zhang, D et al. , Science, 6376 (2018), p. 675.Google Scholar
[3]Liu, L et al. , Nature Chemistry, 2019 (accepted)Google Scholar
[4]This research used resources of the Core Labs of King Abdullah University of Science and Technology (KAUST)Google Scholar