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Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

Published online by Cambridge University Press:  23 September 2015

Sarah J. Haigh ,
Aidan P. Rooney ,
Eric Prestat ,
Fred. Withers ,
O. Del Pozo Zamudio ,
Artem Mishchenko ,
Ali. Gholinia ,
K. Watanabe ,
T. Taniguchi  and
A. I. Tartakovskii
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Sarah J. Haigh
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Aidan P. Rooney
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Eric Prestat
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Fred. Withers
Affiliation:
School of Physics and Astronomy, University of Manchester, Manchester, M13 9PL, UK
O. Del Pozo Zamudio
Affiliation:
Department of Physics and Astronomy, University of Sheffield, Sheffield, S3 7RH, UK
Artem Mishchenko
Affiliation:
School of Physics and Astronomy, University of Manchester, Manchester, M13 9PL, UK
Ali. Gholinia
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
K. Watanabe
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
T. Taniguchi
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
A. I. Tartakovskii
Affiliation:
Department of Physics and Astronomy, University of Sheffield, Sheffield, S3 7RH, UK
Andre K. Geim
Affiliation:
Manchester Centre for Mesoscience and Nanotechnology, University of Manchester, Manchester, M13 9PL, UK
Konstantin. S. Novoselov
Affiliation:
School of Physics and Astronomy, University of Manchester, Manchester, M13 9PL, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 107 - 108
Copyright
Copyright © Microscopy Society of America 2015 

References

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