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Correlative Light and Electron Microscopy (CLEM) for Characterization of Lithium Ion Battery Materials

Published online by Cambridge University Press:  01 August 2010

C Thomas ,
M Edelmann ,
D Lysenkov ,
C Hafner ,
T Bernthaler  and
G Schneider
C Thomas
Affiliation:
Carl Zeiss AG, Germany
M Edelmann
Affiliation:
Carl Zeiss AG, Germany
D Lysenkov
Affiliation:
Carl Zeiss NTS, Germany
C Hafner
Affiliation:
Aalen University, Germany
T Bernthaler
Affiliation:
Aalen University, Germany
G Schneider
Affiliation:
Aalen University, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 784 - 785
Copyright
Copyright © Microscopy Society of America 2010