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Correlative Characterization of Defect Clusters in GaAs Solar Cells by High-Resolution TEM and Spatially Resolved Optical Techniques

Published online by Cambridge University Press:  01 August 2018

B.S. McKeon ,
Q. Chen ,
S. Zhang ,
C.-K. Hu ,
T.H. Gfroerer ,
M.W. Wanlass ,
Y. Zhang  and
David J. Smith
B.S. McKeon
Affiliation:
Department of Physics, Arizona State University, Tempe, Arizona, USA
Q. Chen
Affiliation:
Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC, USA
S. Zhang
Affiliation:
Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC, USA
C.-K. Hu
Affiliation:
Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC, USA Wuhan University of Technology, Wuhan, Hubei, China
T.H. Gfroerer
Affiliation:
Davidson College, Davidson, NC, USA
M.W. Wanlass
Affiliation:
National Renewable Energy Laboratory, Golden, CO, USA
Y. Zhang
Affiliation:
Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC, USA
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, Arizona, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 136 - 137
Copyright
© Microscopy Society of America 2018 

References

References:

[1] This work was supported by Army Research Office Grant #W911NF-16-1-0263. The authors gratefully acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University..Google Scholar