Hostname: page-component-84b7d79bbc-g7rbq Total loading time: 0 Render date: 2024-07-28T03:00:06.114Z Has data issue: false hasContentIssue false
  • English
  • Français

Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector

Published online by Cambridge University Press:  03 August 2008

D Newbury ,
J Davis ,
D Bright ,
N Ritchie ,
J Michael  and
P Kotula
D Newbury
Affiliation:
National Institute of Standards and Technology
J Davis
Affiliation:
National Institute of Standards and Technology
D Bright
Affiliation:
National Institute of Standards and Technology
N Ritchie
Affiliation:
National Institute of Standards and Technology
J Michael
Affiliation:
Sandia National Laboratory
P Kotula
Affiliation:
Sandia National Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1164 - 1165
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)