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Composition of 4H-SiC/SiO2 Interfaces by Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  31 July 2006

J Bentley ,
K-C Chang ,
Y Cao  and
LM Porter
J Bentley
Affiliation:
Oak Ridge National Laboratory
K-C Chang
Affiliation:
Carnegie Mellon University
Y Cao
Affiliation:
Carnegie Mellon University
LM Porter
Affiliation:
Carnegie Mellon University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1142 - 1143
Copyright
© 2006 Microscopy Society of America