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Comparison of Techniques for Fine Alignment of Image Stacks in Serial Block-Face Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Q. He
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
M. Guay
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
G. Zhang
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
R.D. Leapman*
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
*
*Corresponding author: leapmanr@mail.nih.gov

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]This research was supported by the intramural program of the National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health.Google Scholar