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Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

Published online by Cambridge University Press:  01 August 2010

A Kohn ,
A Kovacs ,
S-G Wang ,
C Wang ,
J Dean ,
T Schrefl ,
A Zeltser ,
MJ Carey ,
AK Petford-Long  and
RC C Ward
A Kohn
Affiliation:
University of Oxford, United Kingdom
A Kovacs
Affiliation:
University of Oxford, United Kingdom
S-G Wang
Affiliation:
University of Oxford, United Kingdom
C Wang
Affiliation:
University of Oxford, United Kingdom
J Dean
Affiliation:
University of Sheffield, United Kingdom
T Schrefl
Affiliation:
University of Sheffield, United Kingdom
A Zeltser
Affiliation:
Hitachi Global Storage Technologies
MJ Carey
Affiliation:
Hitachi Global Storage Technologies
AK Petford-Long
Affiliation:
Argonne National Laboratory
RC C Ward
Affiliation:
University of Oxford, United Kingdom

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1914 - 1915
Copyright
Copyright © Microscopy Society of America 2010