Hostname: page-component-84b7d79bbc-2l2gl Total loading time: 0 Render date: 2024-07-28T02:17:56.172Z Has data issue: false hasContentIssue false
  • English
  • Français

A Comparison of Atomic Force Microscopy and Field-Emission Scanning Electron Microscopy for Imaging the Plant Cell Wall

Published online by Cambridge University Press:  01 August 2005

T I Baskin ,
F Marga  and
M Grandbois
T I Baskin
Affiliation:
University of Massachusetts, Amherst, Massachusetts
F Marga
Affiliation:
University of Missouri, Columbia
M Grandbois
Affiliation:
Sherbrooke University, Canada

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1130 - 1131
Copyright
© 2005 Microscopy Society of America