No CrossRef data available.
Article contents
Combining a Nanoprobing Setup with PFIB Sample Deprocessing
Published online by Cambridge University Press: 05 August 2019
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927619005105/resource/name/firstPage-S1431927619005105a.jpg)
- Type
- Advances in Focused Ion Beam Instrumentation and Techniques
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Zudhistira, D, et al. , International Symposium of Testing & Failure Analysis (2017).Google Scholar
[2]Simon-Najasek, M, et al. , International Symposium for Testing and Failure Analysis, (2012).Google Scholar
[3]Zudhistira, D, et al. , International Symposium for Testing and Failure Analysis, (2018).Google Scholar