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Combined Quantitative Analysis Using both Micro-XRF and EDS Analysis Inside the Scanning Electron Microscope

Published online by Cambridge University Press:  09 October 2013

K.C. Witherspoon ,
R. Lamb ,
P. Sjoman  and
M.D. Hellested
K.C. Witherspoon
Affiliation:
R. Lamb
Affiliation:
P. Sjoman
Affiliation:
M.D. Hellested
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1272 - 1273
Copyright
Copyright © Microscopy Society of America 2013