Hostname: page-component-76fb5796d-r6qrq Total loading time: 0 Render date: 2024-04-27T02:08:55.748Z Has data issue: false hasContentIssue false

Combined chemical and structural analysis of low dimensional systems in FEG-SEM

Published online by Cambridge University Press:  30 July 2021

Purvesh Soni
Affiliation:
Bruker Nano GmbH, United States
Laurie Palasse
Affiliation:
Bruker Nano Analytics, Berlin, Berlin, Germany
Meiken Falke
Affiliation:
Bruker Nano GmbH, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Kotula, P., Michael, J., & Rohde, M. (2008). Results from Two Four-Channel Si-drift Detectors on an SEM: Conventional and Annular Geometries. Microscopy and Microanalysis, 14(S2), 116-117. doi:10.1017/S1431927608081701CrossRefGoogle Scholar
Terborg, R., Rohde, M. (2008) New developments in state of the art silicon drift detectors (SDD) and multiple element SDD. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_317Google Scholar
KELLER, R. and GEISS, R. (2012), Transmission EBSD from 10 nm domains in a scanning electron microscope. Journal of Microscopy, 245: 245-251. https://doi.org/10.1111/j.1365-2818.2011.03566.xGoogle Scholar
Brodu, E., Bouzy, E., & Fundenberger, J. (2017). On-axis Transmission Kikuchi Diffraction for Orientation Mapping of Nanocrystalline Materials in the SEM. Microscopy and Microanalysis, 23(S1), 530-531. doi:10.1017/S1431927617003336CrossRefGoogle Scholar
Kothleitner, G., Grogger, W., Dienstleder, M., & Hofer, F. (2014). Linking TEM Analytical Spectroscopies for an Assumptionless Compositional Analysis. Microscopy and Microanalysis, 20(3), 678-686. doi:10.1017/S1431927614000130CrossRefGoogle ScholarPubMed
Watanabe, M, Williams, DB. The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods. J Microsc. 2006 Feb;221(Pt 2):89-109. doi: 10.1111/j.1365-2818.2006.01549.x. PMID: 16499549.CrossRefGoogle Scholar