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Chemical characterization of optical data storage materials by EPMA

Published online by Cambridge University Press:  01 August 2002

S. Richter ,
M. Bückins ,
S. Kyrsta  and
R. Cremer
S. Richter
Affiliation:
Central Facility of Electron Microscopy, RWTH Aachen, 52056 Aachen, Germany
M. Bückins
Affiliation:
Central Facility of Electron Microscopy, RWTH Aachen, 52056 Aachen, Germany
S. Kyrsta
Affiliation:
Lehrstuhl f�r Theoretische H�ttenkunde, RWTH Aachen, 52056 Aachen, Germany
R. Cremer
Affiliation:
Lehrstuhl f�r Theoretische H�ttenkunde, RWTH Aachen, 52056 Aachen, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1488 - 1489
Copyright
Copyright © Microscopy Society of America 2002