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Characterization of N-polar GaN/AlGaN/GaN Heterostructures Using Electron Holography
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 258 - 259
- Copyright
- Copyright © Microscopy Society of America 2014
References
[7] The recent work at ASU was supported under contract to Wyle Laboratories as part of RIAC Contract HC1047-05-D-4005. We gratefully acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar