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Bridging the Synchrotron - Lab Source Gap for Microscopy: The Inverse Compton Scattering X-ray Source

Published online by Cambridge University Press:  10 August 2018

M. Feser ,
R. Ruth ,
R. Loewen  and
J. Kasahara
M. Feser*
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
R. Ruth
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
R. Loewen
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
J. Kasahara
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
*
* Corresponding author, michael_feser@lynceantech.com

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 306 - 309
Copyright
© Microscopy Society of America 2018 

References

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[4] http://www.sigray.com.Google Scholar
[5] Eggl, E., et al, Journal of synchrotron radiation 23(5 2016) p. 1137–1142.Google Scholar