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Bridging the Synchrotron - Lab Source Gap for Microscopy: The Inverse Compton Scattering X-ray Source

Published online by Cambridge University Press:  10 August 2018

M. Feser*
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
R. Ruth
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
R. Loewen
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
J. Kasahara
Affiliation:
Lyncean Technologies, Inc.Fremont, CA, USA.
*
* Corresponding author, michael_feser@lynceantech.com

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Otendal, M., et al, Review of Scientific Instruments 79(1 2008) p. 016102.CrossRefGoogle Scholar
[3] Yun, W., et al, Microscopy and Microanalysis 22(Suppl 3 2016) p. 118.Google Scholar
[5] Eggl, E., et al, Journal of synchrotron radiation 23(5 2016) p. 11371142.Google Scholar