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Beyond Rules-of-Thumb: Optimizing EPMA Measurements

Published online by Cambridge University Press:  05 August 2019

Nicholas W. M. Ritchie
Nicholas W. M. Ritchie*
Affiliation:
National Institute of Standards and Technology, Material Measurement Science Division, Gaithersburg, MD, USA.
*
*Corresponding author: nicholas.ritchie@nist.gov

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2306 - 2307
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Marinenko, R and Leigh, S, IOP Conf Series: Mat Science and Engineering 7(1) (2010), p. 012017.Google Scholar
[2]Ritchie, N and Newbury, D, Analytical Chemistry 84 (2012), p. 9956.Google Scholar