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Bayesian Microscopy: Model Selection for Extracting Weak Nonlinearities from Scanning Probe Microscopy Data
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Jesse, S., Kalinin, S. V., Proksch, R., Baddorf, A. P. a Rodriguez, B. J., Nanotechnology 18 (2007), p. 43550310.1088/0957-4484/18/43/435503CrossRefGoogle Scholar
This research was conducted at the Center for Nanophase Materials Sciences, which also provided support (R. K. V, S. J., S. V. K.) and is a US DOE Office of Science User Facility.Google Scholar