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Automated Orientation Imaging Microscopy of Nanoscale Al Thin Films After Rapid Solidification Using SEM and TEM

Published online by Cambridge University Press:  01 August 2010

A Kulovits ,
G Facco ,
H Kotan  and
JMK Wiezorek
A Kulovits
Affiliation:
University of Pittsburgh
G Facco
Affiliation:
University of Pittsburgh
H Kotan
Affiliation:
University of Pittsburgh
JMK Wiezorek
Affiliation:
University of Pittsburgh

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1726 - 1727
Copyright
Copyright © Microscopy Society of America 2010