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Automated 3D Imaging at Ambient and Cryogenic Conditions

Published online by Cambridge University Press:  01 August 2005

W M Busing ,
F de Haas ,
U Lucken ,
L Melanson ,
W M A Hax  and
M M H Storms
W M Busing
Affiliation:
FEI Company, Eindhoven, The Netherlands
F de Haas
Affiliation:
FEI Company, Eindhoven, The Netherlands
U Lucken
Affiliation:
FEI Company, Eindhoven, The Netherlands
L Melanson
Affiliation:
FEI Company, Eindhoven, The Netherlands
W M A Hax
Affiliation:
FEI Company, Eindhoven, The Netherlands
M M H Storms
Affiliation:
FEI Company, Eindhoven, The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 284 - 285
Copyright
© 2005 Microscopy Society of America