Hostname: page-component-77c89778f8-m8s7h Total loading time: 0 Render date: 2024-07-21T20:22:23.070Z Has data issue: false hasContentIssue false
  • English
  • Français

The Atom-Probe Field Ion Microscope: Applications in Surface M Science

Published online by Cambridge University Press:  02 July 2020

G. L. Kellogg
G. L. Kellogg*
Affiliation:
Sandia National Laboratories, Albuquerque, NM, 87185-1413
Get access

Extract

The ability to locate an individual atom on a surface, remove it in a controlled fashion, and determine its chemical identity makes the atom-probe field-ion microscope an extremely powerful tool for the analysis of solid surfaces. By itself, the field ion microscope has contributed significantly to our understanding of surface atomic structure, single-atom surface diffusion, and the detailed interactions that occur between atoms and defects on surfaces.1 When used in combination with the atom-probe mass spectrometer there have been several additional areas within the traditional definition of "surface science" where the chemical identification capability of the atom probe has led to new insights. In this paper these applications are reviewed focusing on two specific areas: surface segregation in intermetallic alloys and chemical reactions on metal surfaces.

The equilibrium distribution of component species in the near surface region of solid solution alloy may be different from the distribution in the bulk.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 110 - 111
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. For a recent review, see: Kellogg, G. L., Surf. Sci. Rep. 21(1994)1.CrossRefGoogle Scholar
2.Ng, Y. S., Tsong, T. T., and McLane, S. B., Phys. Rev. Lett. 42(1978)588.Google Scholar
3.Tsong, T. T., Ng, Y. S., and McLane, S. B., J .Chem. Phys. 73(1980)1464.CrossRefGoogle Scholar
4.Sakurai, T., Hashizume, T., Jimbo, A., Sakai, A., and Hyodo, S., Phys. Rev. Lett. 55(1985)514.CrossRefGoogle Scholar
5.Ren, D. M. and Tsong, T. T., Surf. Sci. 184(1987)L439.CrossRefGoogle Scholar
6.Kellogg, G. L., J. Phys. E: Sci. Instrum. 20(1987)125.CrossRefGoogle Scholar
7. For a review, see: Tsong, T. T., Atom-Probe Field Ion Microscopy, Cambridge University Press (1990)295–302.CrossRefGoogle Scholar
8.Block, J. H., CRC Crit. Rev. Sol. St. Sci. 6(1976)133.CrossRefGoogle Scholar
9.Kellogg, G. L., Surf. Sci. 111(1981)205.CrossRefGoogle Scholar
10.Ai, C. F. and Tsong, T. T., Surf. Sci. 138(1984)339; J. Chem. Phys. 81(1984)2845.Google Scholar
11.Kellogg, G. L., J. Catal. 92(1985)167.CrossRefGoogle Scholar
12.Kellogg, G. L., Surf. Sci. 171(1986)359.CrossRefGoogle Scholar
13. Work supported by the United States Department of Energy under Contract DE-AC04- 94AL85000.Google Scholar