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Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices

Published online by Cambridge University Press:  23 September 2015

P.J. Phillips
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago IL 60607
P. Longo
Affiliation:
Gatan, INC, Pleasanton, CA 94588
E. Okunishi
Affiliation:
EM Application Group, JEOL Ltd., 3-1-2 Musashino, Tokyo 198558, Japan
R.F. Klie
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago IL 60607

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Kumah, D.P., Disa, A.S., Ngai, J.H., Chen, H., Malashevich, A., Reiner, J.W., Ismail-Beigi, S., Walker, F.J. & Ahn, C.H., Adv. Mater. 26 (2014) 19351940.Google Scholar
[2] Chen, H., Kumah, D.P., Disa, A.S., Walker, F.J, Ahn, C.H. & Ismail-Beigi, S., Phys. Rev. Lett. 110 (2013) 186402.Google Scholar