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Atomic-Resolution Study of Grain Boundaries in CdTe Using Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Jinglong Guo
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL.
Fatih G. Sen
Affiliation:
Argonne National Laboratory, Center for Nanoscale Materials, Argonne, IL.
Luhua Wang
Affiliation:
University of Texas at Dallas, Department of Materials Science and Engineering, Dallas, TX
Seungjin Nam
Affiliation:
University of Texas at Dallas, Department of Materials Science and Engineering, Dallas, TX
Moon Kim
Affiliation:
University of Texas at Dallas, Department of Materials Science and Engineering, Dallas, TX
Maria K. Y. Chan
Affiliation:
Argonne National Laboratory, Center for Nanoscale Materials, Argonne, IL.
Robert F. Klie
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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[5] This work is supported by the U.S. Department of Energy's Office of Enery Efficiency and Renewable Energy (EERE) under Solar Energy Technology Office (SETO) Award Number DE-EE00007545. Use of the Center for Nanoscale Materials, an Office of Science user facility, was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357..Google Scholar