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Atomic-resolution Imaging and Spectroscopy of Iron Oxide Epitaxial Thin Films

Published online by Cambridge University Press:  01 August 2018

A. Carranco-Rodriguez ,
A. Pofelski ,
S. Cheng ,
L. Corbellini ,
A. Pignolet ,
P. Longo  and
G. A. Botton
A. Carranco-Rodriguez
Affiliation:
Department of Materials Science and Eng., McMaster University, Hamilton, ON, Canada.
A. Pofelski
Affiliation:
Department of Materials Science and Eng., McMaster University, Hamilton, ON, Canada.
S. Cheng
Affiliation:
Department of Materials Science and Eng., McMaster University, Hamilton, ON, Canada.
L. Corbellini
Affiliation:
Centre Énergie, Matériaux et Télécommunications, INRS, Varennes, Québec, Canada.
A. Pignolet
Affiliation:
Centre Énergie, Matériaux et Télécommunications, INRS, Varennes, Québec, Canada.
P. Longo
Affiliation:
Gatan Inc., Pleasanton, CA.
G. A. Botton
Affiliation:
Department of Materials Science and Eng., McMaster University, Hamilton, ON, Canada.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1614 - 1615
Copyright
© Microscopy Society of America 2018 

References

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[8] We are pleased to acknowledge NSERC funding for supporting for this work.Google Scholar