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Atomic Precision Measurement of Individual Atom Positions in Defects by Aberration Corrected HRTEM

Published online by Cambridge University Press:  01 August 2005

L Houben ,
A Thust  and
K Urban
L Houben
Affiliation:
Research Centre Jülich, Germany
A Thust
Affiliation:
Research Centre Jülich, Germany
K Urban
Affiliation:
Research Centre Jülich, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2122 - 2123
Copyright
© 2005 Microscopy Society of America