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Microscopy and Microanalysis Microscopy and Microanalysis

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Atomic Imaging and Spectroscopy of Two-Dimensional Materials

Published online by Cambridge University Press:  27 August 2014

Juan Carlos Idrobo ,
Wu Zhou ,
Myron Kapetanakis ,
Micah P. Prange ,
Leonardo Basile ,
Sokrates T. Pantelides  and
Stephen J. Pennycook
Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Wu Zhou
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783,1USA
Myron Kapetanakis
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783,1USA Department of Physics and Astronomy, Vanderbilt University, Nashville TN 37235, USA
Micah P. Prange
Affiliation:
Fundamental and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WA 99352, USA
Leonardo Basile
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Departamento de Física, Escuela Politécnica Nacional, Quito, Ecuador
Sokrates T. Pantelides
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783,1USA Department of Physics and Astronomy, Vanderbilt University, Nashville TN 37235, USA
Stephen J. Pennycook
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
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Abstract

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Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 92 - 93
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Feynman, R.P. “There is plenty of room at the bottom” (1959).
[2] Krivanek, O.L., et al., Nature 464 (2010), 571.
[3] Varela, M., et al., Phys. Rev. Lett. 92 (2004), 095502.
[4] Suenaga, K., Koshino, M. Nature 468 (2010). 1088.
[5] Zhou, W., et al., Phys. Rev. Lett. 109 (2012). 206803.
[6] Ramasse, Q., et al., Nano Letters 13 (2013), 4989.
[7] Krivanek, O.L., et al., Ultramicroscopy 108 (2008) 179.
[8] This research was supported by the Center for Nanophase Materials Sciences (CNMS), which is sponsored at ORNL by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE (JCI),by a Wigner Fellowship through the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (ORNL), managed by UT-Battelle, LLC, for the U.S. DOE (WZ), the National Secretariat of Higher Education, Science, Technology and Innovation of Ecuador (SENESCYT) (LB), and by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. DOE (STP, SJP), and DOE Grant No. DE-FG02-09ER46554 (MDK, MPP, STP). This research used resources of the National Energy Research Scientific Computing Center, which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
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