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Atomic Force Microscopy: A Multifunctional Tool for Materials Characterization in Shared Resource Centers

Published online by Cambridge University Press:  04 August 2017

Brooke B. Massani
Brooke B. Massani*
Affiliation:
Dept. of Chemistry & Biochemistry and office of Research, Discovery & Innovation, University of Arizona, Tucson, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2316 - 2317
Copyright
© Microscopy Society of America 2017 

References

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[2] Martin, Y, Williams, C.C. & Wickramasinghe, H.K. Journal of Applied Physics 61 1987 p4723.CrossRefGoogle Scholar
[3] Zhong, Q., Inniss, D., Kjoller, K. & Elings, V.B. Surface Science Letters 290 1993 pL688.Google Scholar
[4] MacDonald, G.A., Veneman, R.A., Placencia, D. & Armstrong, N.R. ACS NANO 6 2012 p9623.Google Scholar
[5] Samples courtesy of Qingru Wang and Xiushan Zhu.Google Scholar
[6] Samples and images courtesy of James Standfill.Google Scholar
[7] This material is based upon work supported by the National Science Foundation under Grant Number 1337371.Google Scholar