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Atom Probe Tomography Quantification of Alloy Fluctuations in (Al,In,Ga)N

Published online by Cambridge University Press:  04 August 2017

Bastien Bonef
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA
Matthew Laurent
Affiliation:
Electrical, Computer Engineering Department, University of California, Davis, CA, USA
Stacia Keller
Affiliation:
Electrical, Computer Engineering Department, University of California, Santa Barbara, CA, USA
Umesh K. Mishra
Affiliation:
Electrical, Computer Engineering Department, University of California, Santa Barbara, CA, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Laurent, M.A., et al, Journal of Applied Physics 119 2016). p 064501.Google Scholar
[2] Krause, F. F., et al, Ultramicroscopy 156 2015). p 29.Google Scholar
[3] Rigutti, L., et al, Scripta Materialia 2017.Google Scholar
[4] Bonef, B., et al, Nanoscale Research Letters 11 2016). p 461.Google Scholar
[5] Rigutti, L., et al, Journal of Applied Physics 119 2016). p 105704.Google Scholar
[6] Laurent, M.A., et al, Journal of Applied Physics 116 2014). p 183704.Google Scholar
[7] Bonef, B. & Laurent, M. contributed equally to this work.Google Scholar