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Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea
Published online by Cambridge University Press: 26 April 2017
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- Type
- Introduction to Special Issue
- Information
- Microscopy and Microanalysis , Volume 23 , Special Issue 2: Atom Probe Tomography & Microscopy 2016 , April 2017 , pp. 187 - 193
- Copyright
- © Microscopy Society of America 2017