Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-22T13:34:16.997Z Has data issue: false hasContentIssue false

Atom Detection in Time-resolved TEM Image Series: Application of Computer Vision Techniques to Noise-degraded Frames

Published online by Cambridge University Press:  30 July 2021

Ramon Manzorro
Affiliation:
Arizona State University, United States
Yuchen Xu
Affiliation:
Cornell University, United States
Joshua Vincent
Affiliation:
Arizona State University, United States
Roberto Rivera
Affiliation:
University of Puerto Rico-Mayaguez, United States
David Matteson
Affiliation:
Cornell University, United States
Peter Crozier
Affiliation:
Arizona State University, Tempe, Arizona, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Faruqi, A., et al. Nucl. Instrum. Methods Phys. Res, 2018. 878, p. 180-190.CrossRefGoogle Scholar
Lawrence, E. L., et al. Microscopy and Microanalysis, 2020. 26, p. 86-94.Google Scholar
Nord, M., et al. Adv. Struct. Chem. Imaging, 2017. 3, p. 9-20.CrossRefGoogle Scholar
Levin, B. D. A., et al. Ultramicroscopy, 2019. 213, 112978.Google Scholar
Lindeberg, T., et al. Image Vision Comput., 1997. 15, p. 415-434.CrossRefGoogle Scholar
Manzorro, R., et al. , manuscript in preparation.Google Scholar
We gratefully acknowledge support of NSF grant CBET-1604971, NRT-1922658, CCF-1934985, OAC-1940097, OAC-1940124 and OAC-1940276, and the facilities at ASU's John M. Cowley Center for High Resolution Electron Microscopy.Google Scholar