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Approaches for Promoting Accurate Atom Probe Reconstruction

Published online by Cambridge University Press:  25 July 2016

T.J. Prosa ,
B.P. Geiser ,
D. Reinhard ,
Y. Chen  and
D.J. Larson
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
D. Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Y. Chen
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
D.J. Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 664 - 665
Copyright
© Microscopy Society of America 2016 

References

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[3] Larson, D.J., et al, in "Local Electrode Atom Probe Tomography". Springer, New York (2013).Google Scholar
[4] Prosa, T.J., et al, Ultramicroscopy 132 (2013). p. 179.Google Scholar
[5] Gault, B., et al, Microsc. Microanal 14 (2008). p. 296.Google Scholar
[6] Geiser, B.P., et al, Microsc. Microanal 13 (2007). p. 437.CrossRefGoogle Scholar
[7] Vurpillot, F., et al, Ultramicroscopy 132 (2013). p. 19.CrossRefGoogle Scholar