No CrossRef data available.
Article contents
Applications of Low and Ultra-low Energy Scanning Electron Microscopy
Published online by Cambridge University Press: 05 August 2019
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS143192761900309X/resource/name/firstPage-S143192761900309Xa.jpg)
- Type
- Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Müllerová, I and Frank, L, Advances in Imaging and Electron Physics 128 (2003), p. 309.Google Scholar
[4]The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118).Google Scholar