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Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM

Published online by Cambridge University Press:  05 August 2007

M Watanabe
Affiliation:
Lehigh University
M Kanno
Affiliation:
JEOL Ltd
D Ackland
Affiliation:
Lehigh University
C Kiely
Affiliation:
Lehigh University
D Williams
Affiliation:
Lehigh University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

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