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Applications of a Bayesian Based Maximum Entropy Method to Energy Dispersive X-ray Spectra

Published online by Cambridge University Press:  01 August 2005

T Shinkawa ,
N Nakamura ,
H Kato ,
K Shibuya  and
M Nakata
T Shinkawa
Affiliation:
JEOL Ltd., Tokyo, Japan
N Nakamura
Affiliation:
JEOL Ltd., Tokyo, Japan
H Kato
Affiliation:
JEOL Ltd., Tokyo, Japan
K Shibuya
Affiliation:
JEOL Engineering, Tokyo, Japan
M Nakata
Affiliation:
Tokyo University of A and T, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 716 - 717
Copyright
© 2005 Microscopy Society of America