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Application of Schottky Type Field Emission Electron Probe Microanalyser Equipped with Wavelength Dispersive X-ray Spectrometer

Published online by Cambridge University Press:  01 August 2003

H. Takahashi ,
T. Kimura ,
C. Nielsen ,
H. Yamada  and
T. Okumura
H. Takahashi
Affiliation:
JEOL Ltd. Electron Optics Division, Application and Research Center, Tokyo, 196-8558, Japan
T. Kimura
Affiliation:
Materials Engineering Laboratory, National Institute for Materials Science 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
C. Nielsen
Affiliation:
JEOL USA, INC. 11 Dearborn Road, Peabody, MA. 01960, USA
H. Yamada
Affiliation:
JEOL Ltd. Electron Optics Division, Application and Research Center, Tokyo, 196-8558, Japan
T. Okumura
Affiliation:
JEOL Ltd. Electron Optics Division, Application and Research Center, Tokyo, 196-8558, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1274 - 1275
Copyright
Copyright © Microscopy Society of America 2003