Hostname: page-component-5c6d5d7d68-lvtdw Total loading time: 0 Render date: 2024-08-19T03:58:51.440Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis

Published online by Cambridge University Press:  06 August 2003

Ralf Terborg  and
Martin Rohde
Ralf Terborg
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany
Martin Rohde
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 120 - 121
Copyright
Copyright © Microscopy Society of America 2003