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Angstrom-scale Magnetic Measurements of a Metallic Antiferromagnet with 4D-STEM

Published online by Cambridge University Press:  30 July 2021

Jeffrey Huang
Affiliation:
University of Illinois at Urbana-Champaign, United States
Kayla Nguyen
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Manohar Karigerasi
Affiliation:
University of Illinois at Urbana-Champaign, United States
Kisung Kang
Affiliation:
University of Illinois at Urbana-Champaign, United States
André Schleife
Affiliation:
University of Illinois at Urbana-Champaign, United States
Daniel Shoemaker
Affiliation:
University of Illinois at Urbana-Champaign, United States
David Cahill
Affiliation:
University of Illinois at Urbana-Champaign, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Pinshane Huang
Affiliation:
University of Illinois at Urbana-Champaign, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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This work was supported by AFOSR grant number AF FA9550-20-1-0302 and NSF-MRSEC award number DMR-1720633. Experiments were carried out in the Cornell Center for Materials Research Shared Facilities (supported through the NSF MRSEC program (DMR-1719875)) and in the Materials Research Laboratory Central Research Facilities at the University of Illinois.Google Scholar
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