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Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector*

Published online by Cambridge University Press:  23 September 2015

Jason Holm  and
Robert Keller
Jason Holm
Affiliation:
National Institute of Standards and Technology, Materials Measurement Lab., Boulder, CO 80305
Robert Keller
Affiliation:
National Institute of Standards and Technology, Materials Measurement Lab., Boulder, CO 80305

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1867 - 1868
Copyright
Copyright © Microscopy Society of America 2015 

Footnotes

*

Contribution of the U.S. Department of Commerce; not subject to copyright in the United States.

References

References:

[1] Klein, T., et al., in Advances in Imaging and Electron Physics, P.W. Hawkes (Ed.), 171 (2012) 297.Google Scholar
[2] Hondow, N., et al., Nanotoxicology 5 (2011) 215.Google Scholar
[3] Kuwajima, M., et al., PLOS ONE 8 (2013) e59573.Google Scholar
[5] Findlay, S. D., et al., Ultramicroscopy 110 (2010) 903.Google Scholar
[6] Rubin, G., et al., Ultramicroscopy 113 (2012) 131.Google Scholar
[7] Cowley, J. M., J. Electron Micros 50 (2001) 147.Google Scholar
[8] J. Holm acknowledges funding from the National Research Council Postdoctoral Research Associateship Program.Google Scholar