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Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector*

Published online by Cambridge University Press:  23 September 2015

Jason Holm
Affiliation:
National Institute of Standards and Technology, Materials Measurement Lab., Boulder, CO 80305
Robert Keller
Affiliation:
National Institute of Standards and Technology, Materials Measurement Lab., Boulder, CO 80305

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

Footnotes

*

Contribution of the U.S. Department of Commerce; not subject to copyright in the United States.

References

References:

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[8] J. Holm acknowledges funding from the National Research Council Postdoctoral Research Associateship Program.Google Scholar