Hostname: page-component-84b7d79bbc-g7rbq Total loading time: 0 Render date: 2024-07-31T22:33:24.840Z Has data issue: false hasContentIssue false
  • English
  • Français

Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging

Published online by Cambridge University Press:  04 August 2017

Jason Holm
Jason Holm*
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 558 - 559
Copyright
© Microscopy Society of America 2017 

References

[1] Buhr, E., et al, Meas. Sci. Technol 20 2009 084025.CrossRefGoogle Scholar
[2] Kuwajima, M., et al, PLOS ONE 8 2013 e59573.CrossRefGoogle Scholar
[3] Guise, O., et al, Polymer 52 2011 1278–1285.CrossRefGoogle Scholar
[4] Hondow, N., et al, Nanotoxicololgy 5 2011 215–227.Google Scholar
[5] Garcia-Negrete, C. A., et al, Analyst 140 2015 3082–3089.CrossRefGoogle Scholar
[6] Keller, R. & Geiss, R. J. Microscopy 245 2012 245–251.CrossRefGoogle Scholar
[7] Trimby, P., et al, Acta Mater 62 2014 69–80.Google Scholar
[8] Morandi, V. & Merli, P. J. Appl. Phys 101 2007 114917.Google Scholar
[9] Volkenand, T., et al, Microsc. Microanal 16 2010 604–613.CrossRefGoogle Scholar
[10] Pfaff, M., et al, J. Microsc 243 2011 31–39.CrossRefGoogle Scholar
[11] Holm, J. & Keller, R. Ultramicroscopy 167 2016 43–56.Google Scholar
[12] This work is a contribution of the US Government and is not subject to copyright in the United States.Google Scholar