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Analytical Electron Microscopy: Rivaling / Complementing Atom Probe Tomography

Published online by Cambridge University Press:  05 August 2019

MG Burke  and
Joven J H Lim
MG Burke
Affiliation:
Materials Performance Centre, University of Manchester, Oxford Road, Manchester, UK.
Joven J H Lim
Affiliation:
UK Atomic Energy Authority, Culham Science Centre, Abingdon, UK

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2264 - 2265
Copyright
Copyright © Microscopy Society of America 2019 

References

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[3]Williams, DB, Practical Analytical Electron Microscopy in Materials Science (Philips Electron Optics Publishing Group, Mahwah).Google Scholar
[4]Cerezo, A, Godfrey, TJ and Smith, GDW, J. Phys. 49 (C6) (1988), p. 25.Google Scholar
[5]Blavette, D et al. , Rev. Sci. Inst. 64 (1993), p. 2911.Google Scholar
[6]Kelly, TF et al. , Microsc. Microanal. 10 (2004), p. 373.Google Scholar
[7]Burke, MG and Miller, MK, Superalloys 718, 625 & Various Derivatives, (TMS, 1991), p. 337.Google Scholar
[8]The authors acknowledge the support from EPSRC Grant No. EP/N017854/1 and EP/N017854/1.Google Scholar