Hostname: page-component-76fb5796d-dfsvx Total loading time: 0 Render date: 2024-04-26T23:47:49.393Z Has data issue: false hasContentIssue false
  • English
  • Français

The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity

Published online by Cambridge University Press:  05 August 2019

Pat Trimby ,
Angus Bewick ,
Daniel Abou-Ras ,
Pietro Caprioglio ,
Dieter Neher  and
Laura Otter
Pat Trimby*
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK.
Angus Bewick
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK.
Daniel Abou-Ras
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, Germany.
Pietro Caprioglio
Affiliation:
Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany.
Dieter Neher
Affiliation:
Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany.
Laura Otter
Affiliation:
Department of Earth & Planetary Science, Macquarie University, Sydney, Australia.
*
*Corresponding author: pat.trimby@oxinst.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2394 - 2395
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jeon, NJ et al. , Nature 517 (2015), p. 476.Google Scholar
[2]Otter, L et al. , Biogeosciences (2019). https://doi.org/10.5194/bg-2018-469Google Scholar
[3]Abbasi, K et al. , Microscopy & Microanalysis 24 (2018), p. 420.Google Scholar
[4]Jiang, C and Zhang, P, J. Appl. Phys 123 (2018), p. 083105.Google Scholar
[5]US Patent US8890065B2: Apparatus and method for performing microdiffraction analysis.Google Scholar
[6]Vespucci, S et al. , Physical Review B 92 (2015), p. 205301.Google Scholar