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Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction

Published online by Cambridge University Press:  23 September 2015

Arantxa Vilalta-Clemente ,
Jun Jiang ,
Ben Britton ,
David M Collins  and
Angus Wilkinson
Arantxa Vilalta-Clemente
Affiliation:
Department of Materials. University of Oxford, Parks Road, Oxford, OX1 3PH
Jun Jiang
Affiliation:
Department of Materials, Imperial College London, Prince Consort Road, London, SW7 2AZ, UK
Ben Britton
Affiliation:
Department of Materials, Imperial College London, Prince Consort Road, London, SW7 2AZ, UK
David M Collins
Affiliation:
Department of Materials. University of Oxford, Parks Road, Oxford, OX1 3PH
Angus Wilkinson
Affiliation:
Department of Materials. University of Oxford, Parks Road, Oxford, OX1 3PH

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1891 - 1892
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Wilkinson, A.J., Meaden, G. & Dingley, D.J., Ultramicroscopy 106 (2006). p 307.Google Scholar
[2] Britton, T.B. & Wilkinson, A.J., Ultramicroscopy 114 (2012). p 82.CrossRefGoogle Scholar
[3] Nye, J.F., Acta Metallurgica 1 (1953). p 153.CrossRefGoogle Scholar
[4] Jiang, J., Britton, T.B. & Wilkinson, A.J., Ultramicroscopy 125 (2013). p 1.Google Scholar
[5] Groma, I., Physical Review B 57 (1998). p 7535.Google Scholar
[6] Wilkinson, A.J., et al, Applied Physics Letters 105 (2014). p 181907.Google Scholar
[7] We acknowledge ESPRC funding under grants EP/K034332/1, EP/J0 16098/1, & EP/I021043/2.Google Scholar