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Analyses of Semiconductor Materials by Spectrometric Full-color Cathodoluminescence Microscopy

Published online by Cambridge University Press:  01 August 2010

H Saijo ,
Y Suzuki  and
M Shiojiri
H Saijo
Affiliation:
Kinki University, Japan
Y Suzuki
Affiliation:
Kinki University, Japan
M Shiojiri
Affiliation:
Kyoto Institute of Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 806 - 807
Copyright
Copyright © Microscopy Society of America 2010