An Interface Study Using Electron Energy-Loss Near-Edge Structure

Q Jin

doi:10.1017/S1431927610057715

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An Interface Study Using Electron Energy-Loss Near-Edge Structure

Published online by Cambridge University Press: 01 August 2010

Q Jin

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Q Jin: Affiliation:
Micron Technology, Inc

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1902 - 1903

DOI: https://doi.org/10.1017/S1431927610057715 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2010

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An Interface Study Using Electron Energy-Loss Near-Edge Structure

Volume 16, Supplement S2
Q Jin ^(a1)
DOI: https://doi.org/10.1017/S1431927610057715

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An Interface Study Using Electron Energy-Loss Near-Edge Structure

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