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Advantages of Monochromated Low Voltage Aberration Corrected TEM

Published online by Cambridge University Press:  01 August 2010

DC Bell ,
C Russo ,
S Meyer ,
G Benner  and
M Haider
DC Bell
Affiliation:
Harvard University
C Russo
Affiliation:
Harvard University
S Meyer
Affiliation:
Carl Zeiss NTS GmbH, Germany
G Benner
Affiliation:
Carl Zeiss NTS GmbH, Germany
M Haider
Affiliation:
CEOS GmbH, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 118 - 119
Copyright
Copyright © Microscopy Society of America 2010