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Advantages of Cs-correctors for Spectrometry in STEM

Published online by Cambridge University Press:  01 August 2005

M Watanabe ,
D W Ackland ,
A Burrows ,
C J Kiely ,
D B Williams ,
M Kanno  and
R Hynes
M Watanabe
Affiliation:
Lehigh University
D W Ackland
Affiliation:
Lehigh University
A Burrows
Affiliation:
Lehigh University
C J Kiely
Affiliation:
Lehigh University
D B Williams
Affiliation:
Lehigh University
M Kanno
Affiliation:
JEOL USA
R Hynes
Affiliation:
JEOL USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2132 - 2133
Copyright
© 2005 Microscopy Society of America