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Advances in Imaging the Chemical State of the Sample Surface with XPS

Published online by Cambridge University Press:  23 November 2012

C. Moffitt ,
D. Surman ,
A. Roberts  and
S. Hutton
C. Moffitt
Affiliation:
Kratos Analytical, Inc., Chestnut RIdge, NY
D. Surman
Affiliation:
Kratos Analytical, Inc., Chestnut RIdge, NY
A. Roberts
Affiliation:
Kratos Analytical, Ltd., Manchester, United Kingdom
S. Hutton
Affiliation:
Kratos Analytical, Ltd., Manchester, United Kingdom
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 894 - 895
Copyright
Copyright © Microscopy Society of America 2012

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