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Advanced Large Active Area SDD for X-Ray Spectroscopy

Published online by Cambridge University Press:  03 August 2008

VD Saveliev ,
CR Tull ,
L Feng ,
S Barkan ,
M Takahashi  and
EV Damron
VD Saveliev
Affiliation:
SII NanoTechnology USA Inc
CR Tull
Affiliation:
SII NanoTechnology USA Inc
L Feng
Affiliation:
SII NanoTechnology USA Inc
S Barkan
Affiliation:
SII NanoTechnology USA Inc
M Takahashi
Affiliation:
SII NanoTechnology USA Inc
EV Damron
Affiliation:
SII NanoTechnology USA Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1140 - 1141
Copyright
© 2008 Microscopy Society of America

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