Hostname: page-component-77c89778f8-fv566 Total loading time: 0 Render date: 2024-07-20T02:12:37.985Z Has data issue: false hasContentIssue false
  • English
  • Français

Advanced Large Active Area SDD for X-Ray Spectroscopy

Published online by Cambridge University Press:  03 August 2008

VD Saveliev ,
CR Tull ,
L Feng ,
S Barkan ,
M Takahashi  and
EV Damron
VD Saveliev
Affiliation:
SII NanoTechnology USA Inc
CR Tull
Affiliation:
SII NanoTechnology USA Inc
L Feng
Affiliation:
SII NanoTechnology USA Inc
S Barkan
Affiliation:
SII NanoTechnology USA Inc
M Takahashi
Affiliation:
SII NanoTechnology USA Inc
EV Damron
Affiliation:
SII NanoTechnology USA Inc
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1140 - 1141
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)