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Advanced Instrumentations for Interface Studies by Electron Energyloss Spectroscopy (EELS, ELNES and ESI)

Published online by Cambridge University Press:  02 July 2020

M. Rühle ,
C. Elsässer ,
C. Scheu  and
W. Sigle
M. Rühle
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestrasse 92, 70174, Stuttgart, Germany
C. Elsässer
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestrasse 92, 70174, Stuttgart, Germany
C. Scheu
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestrasse 92, 70174, Stuttgart, Germany
W. Sigle
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestrasse 92, 70174, Stuttgart, Germany
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Extract

Most materials used in technology are polycrystalline. Therefore, the properties of the internal interfaces often control the properties of the materials (interface-controlled materials). In single phase polycrystalline materials, grain boundaries are the internal interfaces (homophase boundaries) of interest, whereas in composites interfaces between different components (heterophase boundaries) play a crucial role. It is of great importance to investigate the structure, composition and bonding of the different interfaces. The atomistic structure of specific interfaces is obtained by high-resolution transmission electron microscopy studies, whereas analytical electron microscopy (AEM) investigations produce information on the composition of interfaces. AEM studies include energy-dispersive X-ray spectroscopy (EDX) as well as electron energy-loss spectroscopy (EELS). From the energy-loss near-edge structure (ELNES) of ionization edges measured by EELS, information on the local electronic structure at interfaces can be obtained. Information on bonding and its modifications by segregated atoms can be extracted from the ELNES studies.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 188 - 189
Copyright
Copyright © Microscopy Society of America

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References

1 Rühle, M., Mayer, J., Sigle, W., Probst, W., to be publishedGoogle Scholar

2 Uhlemann, S. and Rose, H., Optik 96, (1994) 163Google Scholar

3 This work is financially supported by the Deutsche Forschungsgemeinschaft (DFG) (contract No. Ru 342/16-1, contract monitor: Dr. Bröcker W.), the Ministry of Science, Research and Art of the state of Baden-Wurttemberg and the Universities of Stuttgart and Tubingen.

4 Valuable discussion with Mayer, J., Probst, W. (LEO), Haider, M. (CEOS) are acknowledged.Google Scholar