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Advanced FIB/SEM Characterization of Nuclear Materials in the Irradiated Materials Characterization Lab

Published online by Cambridge University Press:  30 July 2020

Daniel Murray ,
Fei Teng ,
Narayan Poudel  and
Krzysztof Gofryk
Daniel Murray
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Fei Teng
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Narayan Poudel
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Krzysztof Gofryk
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States

Abstract

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Type
Advanced Characterization of Nuclear Fuels and Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1664 - 1665
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Copyright
Copyright © Microscopy Society of America 2020

References

Moore, K. T., and van der Laan, G., Reviews of Modern Physics (2009) 81 (1), 23510.1103/RevModPhys.81.235CrossRefGoogle Scholar
Yin, Q., et al. , Physical Review B (2011) 84 (19)Google Scholar
Shrestha, K., and Gofryk, K., Rev Sci Instrum (2018) 89 (4), 04390510.1063/1.5005493CrossRefGoogle Scholar