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Adaptive Peak Fitting for Isotope Analysis via Atom Probe Mass Spectrometry

Published online by Cambridge University Press:  30 July 2021

Frederick Meisenkothen ,
Daniel Samarov ,
Mark McLean ,
Irina Kalish  and
Eric Steel
Frederick Meisenkothen
Affiliation:
National Institute of Standards and Technology, United States
Daniel Samarov
Affiliation:
National Institute of Standards and Technology, United States
Mark McLean
Affiliation:
National Institute of Standards and Technology, United States
Irina Kalish
Affiliation:
MATSYS, Inc., United States
Eric Steel
Affiliation:
National Institute of Standards and Technology, United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 176 - 177
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Disclaimer: Certain commercial equipment, instruments, or materials are identified in this paper in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
Meisenkothen, F., Samarov, D.V., Kalish, I., Steel, E.B., “Exploring the accuracy of isotopic analyses in atom probe mass spectrometry," Ultramicroscopy, 216, 2020.CrossRefGoogle Scholar
Thuvander, M., Kvist, A., Johnson, L.J.S., Weidow, J., Andrén, H.-O., "Reduction of multiple hits in atom probe tomography," Ultramicroscopy, 132 (2013) 81-85.Google Scholar